Yan (Simon) Sun is a Ph.D. student in Educational Statistics and Measurement at Graduate School of Education and minored in Applied Statistics (M.S.) at Department of Statistics at Rutgers University. He is currently advised by Dr. Jimmy de la Torre and Dr. Chia-Yi Chiu.
Simon’s research interests are mainly in advanced educational measurement models, especially cognitive diagnostic models (CDM) that facilitate classroom teaching and learning. He has been doing several research projects in CDM, such as general nonparametric classification method, general Q-matrix refinement method, Wald-test for DIF detection, and looking for new model fit techniques in CDMs.
He earned his M.S. and B.S. in Psychology at Beijing Normal University. His master thesis was titled “Does Instructional Leadership Matter in China: A Propensity Score Approach”.